Exploring Surface Silanization and Characterization of Thin Films: From Surface Passivation to Microstructural Characterization of Porous Silicon/Silica, and Exploratory Data Analysis of XRay Photoelectron Spectroscopy Images
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Book Details :
Exploring Surface Silanization and Characterization of Thin Films: From Surface Passivation to Microstructural Characterization of Porous Silicon/Silica, and Exploratory Data Analysis of XRay Photoelectron Spectroscopy Images